Newsletter July 2019 
 
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The implementation of new standards in light measurement technology presents a great technological challenge to all industries – particularly where compliance with the latest OEM specifications for automotive interior displays is concerned. Read our new white paper on the subject and make a note in your diary of the most important dates of the year, including live demonstrations and discussions with our experts:
 
Training seminar:
Moderne Licht- und Displaymesstechnik
26–27 November 2019 at the Novotel, Munich-East
 
We look forward to meeting you for lively discussions.
Seminar reservations at: seminar@instrumentsystems.com
 
Your Instrument Systems Team
\\ HIGHLIGHTS AT A GLANCE
  End-of-line (EOL) testing for the latest automotive display standards

  Article: In-Line VCSEL Testing
  Brochure: DMS series – goniometer systems for display characterization
  Seminar: Moderne Licht- und Displaymesstechnik
 
\\ AUTOMOTIVE
oem
End-of-line (EOL) testing for the latest automotive display standards

Automotive manufacturers have agreed on new quality standards for the analysis of automotive interior displays. These must be implemented by suppliers and also checked in production. Instrument Systems offers innovative measurement solutions for fast end-of-line verification of the latest OEM display quality standards, e.g. for color, homogeneity, gamma value and pixel defects.
 
White paper on the topic:
“EOL Testing of Recent OEM Display Quality Standards”
 
more
 
article vcsel
 
Article: In-Line VCSEL Testing

 
In comparison to established measuring techniques, array spectroradiometers can fulfill the stringent requirements for spectral resolution, throughput and reliability that are applicable in particular in production environments. They are thus ideally suited to the optical production control of laser diodes – also VCSEL.
 
Article on the topic appeared in PhotonicsViews 3/2019:
“In-Line VCSEL Testing”
 
more
 
dms
 
Brochure: DMS series – goniometer systems for display characterization

 
The DMS series from Instrument Systems is accepted as a global standard for electro-optical testing of displays, as well as materials and components used. The new product brochure describes in detail the possible measurement setups, accessories and diverse functions of the extensive analysis software.
 
PDF Download:
 
more
 
\\ SAVE THE DATE

seminar
 
Seminar: Moderne Licht- und Displaymesstechnik

 
For the fifth time in succession, Instrument Systems is offering a two-day light measurement technology seminar with lectures and live demos. Our experienced product specialists will be presenting a broad spectrum of measuring methods for LEDs, luminaires and displays with practical orientation. The emphasis will lie on current challenges facing us on a daily basis in the lab, quality assurance and production.
 
If you wish to extend your knowledge, secure your place today – and mention the date to interested colleagues!
 
Seminar date:
26–27 November 2019 at the Novotel, Munich-East
 
 
 
\\ UPCOMING EVENTS - MEET US IN PERSON!
touch taiwan
 
Taipei, Taiwan
28-30 August 2019
 
 
Booth 
 
 
isal
 
Darmstadt, Germany
23-25 September 2019
 
 
Booth 
 
 
lps
 
Bregenz, Austria
24-26 September 2019
 
 
Booth #A13 
 
vehicle displays
 
Detroit, USA
24-25 September 2019
 
 
Booth #65 
 
 
lichtwoche
 
Munich, Germany
31.10. - 08.11.2019
 
 
Lecture 
 
 
productronica
 
Munich, Germany
12-15 November 2019
 
 
Booth #A1.145 
 

 

 

 

Newsletter April 2019 

Instrument Systems Newsletters

 
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We kindly invite you to participate in SID Display Week taking place in San Jose, CA/USA May 14-16th, 2019. Instrument Systems will exhibit high-end measurement systems for “Display Quality Control”, “AR/VR-Measurement” and “Display Production Testing”. The Society for Information Display has selected our latest product innovation to be shown at the Innovation-Zone: We will present an ultra-high resolution model of the LumiTop, which has been developed for subpixel metrology of Micro-LEDs and OLEDS. Take advantage and discuss innovative applications for this new imaging colorimeter with our display experts onsite!
 

 
We are looking forward to your visit in the I-Zone and at our booth # 1528!
 
Your Instrument Systems Team
sales@instrumentsystems.com
\\ HIGHLIGHTS AT A GLANCE
 Subpixel metrology of MicroLED and AR/VR display applications
 Display Week Lectures
 CIE 2019, 29th Session in Washington
 Optronik News
 
\\ DISPLAY WEEK 2019
Subpixel metrology of MicroLED and AR/VR display applications
einladung

At Display Week Exhibition in San Jose, CA / USA from May 14 - 16th Instrument Systems GmbH will put spotlight on applications representing the major trend in the display industry: more pixels. µLEDs are a strong candidate for the realization of very high display resolutions with pixel sizes as small as 10 µm and equally small pixel pitches. A higher resolution means that imaging light measurement devices must advance accordingly.

 
Within its LumiTop series, Instrument Systems developed an ultra-high resolution camera with an extraordinary technical design and outstanding measuring portfolio for unprecedented accuracy and high speed 2D measurements. In the Innovation-Zone of the Display Week Exhibition the light measuring device will be presented in an application for display testing in production lines where tact times are extremely short.
 
At Instrument Systems GmbH booth #1528 the LumiTop is showcased with a head-mounted display to be measured as innovative AR/VR display application. Additionally, high-end measurement systems for quality control, automotive applications, and production testing will be presented by our light measurement experts.
 
mehr zum thema
 
dw
 
Display Week Lectures

 
Instrument Systems actively participates in presentations and discussions at the Display Week Symposium 2019 and presents three lectures on current topics in display metrology:
 
May 13 / Session 06 / 10:20-11:50 AM / Room LL21ABC
"Display Metrology: Basics, Framework, and Applications"
 
May 16 / Session 50.1 / 09:00-10:20 AM / Room LL20A
"Flicker from Electronic Displays: Reconsidering the Confusion"
Co-Chair: Jürgen Neumeier, Instrument Systems
 
May 17 / Session 83.1 / 10:40-11:00 AM / Room LL20A
"OLED vs. LC Displays - The Race toward Rec. 2020 and HDRI"
 
Speaker: Dr. Michael Becker, Instrument Systems
 
Interested in lecture abstracts?
 
more
 
cie
 
CIE 2019, 29th Session in Washington

 
The CIE is a scientific non-profit organization that provides an international forum relating to the science, technology and art in the fields of light and lighting. The CIE develops basic standards and procedures of metrology and maintains interaction with other international organizations. Instrument Systems supports the work of the CIE and is regularly active with lectures and as a sponsor at CIE conferences.
 
CIE 2019 29th Quadrennial Session
June 14 - 22, 2019 / Washington DC, USA
 
"Evaluation of Blue Light Hazard"
Speaker: Dr. Ðenan Konjhodžić, Instrument Systems
 
Interested in lecture abstracts?
 
more
 
\\ LATEST PAPER

OPTRONIK LINE

 
led-professional.com
 

On-the-Fly Light Measurement of Modulated LEDs

 

Instrument Systems addresses increasing demands on light measurement technology in the automotive sector: the goniophotometer AMS 5000 combined with the DSP 200 photometer offers a perfect solution for testing modulated LEDs, which today ensure a driving experience under optimum lighting conditions.

 
Complete article published on led-professional.com:
 
goniometer
 
 
\\ UPCOMING EVENTS - MEET US IN PERSON!
dvn
 
Shanghai Marriott Parkview Hotel China
24-25 April 2019
 
Booth 
 
 
sid
 
San Jose Convention Center USA
14-16 May 2019
 
Booth #1528 
 
 
gile
 
Guangzhou, China
09-12 June 2019
 
 
Booth 
 
cie
 
Washington, USA
14-22 June 2019
 
 
Lecture 
 
 
laser
 
Messe München Germany
24-27 June 2019
 
Hall A2 Booth #215 
 
 
led_oled
 
Korea International Exhibition Center Korea
25-27 June 2019
 
Booth